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Wafer Trimming System
inTEST Manipulators / Docking Plates / Testing Interfaces
WT-350 Manipulator
Centrifuge Systems
Solderability Tester (ST88)
Automated Flatness Inspection Systems
HAST/PCT Chambers ( Highly Accelerated Stress Test Chambers )
Thermo Forcing Systems
Ecomet250 Grinder / Polisher
I/V Curve Tracers
Scanning Acoustic Microscopes (SAM)
X-ray Inspection Systems
Accura-C Capsule Weighing System
Solar Simulators (OAI TriSOL SLPSS)
Double Sided Mask Aligner System
Projection Mask Aligner
UV Mask Aligners
Wafer Precision Dicing
Tertiary Raman Spectroscopic Microscopy Systems (S&I)
Precision Systems (Okamoto)
Micro-region in situ optical multi-characterization system
ProEM-HS EMCCD (TPI)
emICCD (TPI)
Raptor Toucan 261 – OEM Spectroscopy
NIRvana HS Cameras (TPI)
COSCMOS Cameras (TPI)
S&I Double Monochromator Series
S&I Triple Raman Spectrometer
Thermo Scientific Fourier Transform IR Spectrometers
Thermo Scientific Micro Raman Spectrometers
Customized microscopic confocal microscopy/Raman/fluorescence/life systems
Femtosecond laser
Electrochemical acquisition and analysis system
CCD (TPI)
Mid-infrared thermal imaging component products
Integrated characterization system for optoelectronic (OPQE)
VGA InGaAs Cameras
Teledyne Photometrics – SCMOS detector
Software introduction
LDI high-energy laser diode light source
Diffractive optical design software
RP series laser software design
LED QE Test Systems
Phaos super-resolution optical microscope
FORTEC micro hyperspectral imaging system
LASCAD software
Teledyne QImaging CCD detector
TELOPS medium wave infrared camera
ZephIR 1.7um infrared camera
Photon high-speed camera
Chromacity OPO Broadband mid-infrared, near-infrared light source
IPS semiconductor lasers, semiconductor laser diode light sources
Teledyne Princeton Instruments Spectrometer
Haiyang optical spectrometer
Microscopic mid- and far-infrared fluorescence spectroscopy system
Light Machinery Inc.’s Brillouin spectrometer
In vivo imaging of small animals in the near-infrared two-zone zone
Dynamic interferometer
SLIM1000 scanning light field microscope
Fast full scattering measurement device
LZH Laser absorption calorimeter
LZH Vacuum UV spectrophotometer
Nanosurf atomic force microscope
Horiba 顆粒分析儀
Bond Testers
化學開封機
電鏡製樣設備
激光開封機
測量儀
掃描電子顯微鏡
Highly Accelerated Stress Test (HAST)
顯微鏡
分析儀
功率傳感器
示波器
Hanwa ESD Inspection System (HED-S5000R)
Ersa POWERFLOW N2 波峰焊
Ersa返修台
回流焊系統Ersa HOTFLOW 3/20
3D OpticalProfiler
氙燈
檢漏儀 HELIO
激光橢偏儀
SI ALD LL矽層沉積
反應離子刻蝕機Etchlab 200
感應耦合等離子刻蝕機SI 500
Photomask clean 清洗機
方形基片勻膠機 200×200
EBR邊緣清洗機
全息光柵勻膠機 Holographic grating coater
勻膠、顯影處理系統-Auto Track
砂輪劃片機 dising cuting
桌面式旋塗機 Table coater
3D Micro-nano Topography Measuring
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