German fast full scattering measuring device（FASTS）
The principle of fast full scattering device (FASTS) is based on the ultraslicity integrating sphere to collect all the scattering energy when the laser is irradiated at a point on the substrate plane.
Application range: Spectral range from ultraviolet to near-infrared (190 nm -910 nm) with corresponding radiation sources and detectors, a laser of a specific wavelength integrated in the standard version of the device. An adjustable spatial filter is used to optimize the beam quality of the laser and the selected test wavelength is optimized. Fully scattered TS Mapping imaging of the sample can be measured using the two-dimensional translation and rotational movement of the sample. Calibration of test results is performed under certified standard sample comparisons that are available on the market for the spectral range from ultraviolet to near infrared。
Test cases
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